- electron beam charge
- • električno opterećenje elektro; naboj elektrona; naelektrisanje elektrona
English-Serbian dictionary. 2013.
electron beam charge
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Electron beam lithography — (often abbreviated as e beam lithography) is the practice of scanning a beam of electrons in a patterned fashion across a surface covered with a film (called the resist),cite book |last= McCord |first=M. A. |coauthors=M. J. Rooks |title=… … Wikipedia
Electron beam ion trap — (or its acronym EBIT) is used in physics to denote an electromagnetic bottle that produces and confines highly charged ions. It was invented by R. Marrs [Levine et al, 1988] and M. Levine at LLNL.An EBIT uses an electron beam focused by means of… … Wikipedia
Electron beam induced current — (EBIC) is a semiconductor analysis technique performed in a scanning electron microscope (SEM) or scanning transmission electron microscope (STEM). It is used to identify buried junctions or defects in semiconductors, or to examine minority… … Wikipedia
Electron Beam Ion Source — Eine Electron Beam Ion Trap (EBIT, Elektronenstrahl Ionenfalle) ist eine spezielle Art von Ionenfalle. Dieser Typ Falle eignet sich insbesondere für die Erzeugung und Speicherung hochgeladener Ionen. In ihr werden niedriggeladene Ionen… … Deutsch Wikipedia
Electron Beam Ion Trap — Eine Electron Beam Ion Trap (EBIT) bzw. Elektronenstrahl Ionenfalle ist eine spezielle Art von Ionenfalle. Dieser Typ Falle eignet sich insbesondere für die Erzeugung und Speicherung hochgeladener Ionen. In ihr werden niedriggeladene Ionen… … Deutsch Wikipedia
Electron beam physical vapor deposition — Traduction à relire Electron beam physical vapor deposition → … Wikipédia en Français
Proximity effect (electron beam lithography) — The proximity effect in electron beam lithography (EBL) is the phenomenon that the exposure dose distribution, and hence the developed pattern, is wider than the scanned pattern, due to the interactions of the primary beam electrons with the… … Wikipedia
Electron diffraction — is a technique used to study matter by firing electrons at a sample and observing the resulting interference pattern. This phenomenon occurs due to the wave particle duality, which states that a particle of matter (in this case the incident… … Wikipedia
Electron crystallography — is a method to determine the arrangement of atoms in solids using a transmission electron microscope (TEM). Contents 1 Comparison with X ray crystallography 2 Radiation damage 3 Protein structures determined by electron crystallography … Wikipedia
Charge induced voltage alteration — (CIVA) is a technique which uses a scanning electron microscope to locate open conductors on CMOS integrated circuits. This technique is used in semiconductor failure analysis. Theory of operation The scanning of an electron beam across the… … Wikipedia
Charge Induced Voltage Alteration — (CIVA) is a technique which uses a scanning electron microscope to locate open conductors on CMOS integrated circuits. This technique is used in semiconductor failure analysis.Theory of operationThe scanning of an electron beam across the surface … Wikipedia
